I have a proximity design based on the DA14580 tag application note.
It is currently undergoing BLE 4.1 certification testing and is failing the "Max Frequency Drift" test.
I have attached the report from the test house. I am confirming that the 16M crystal was "tuned" but at this stage this is our assumption according to the factory.
Can you shed any light on this, and is there anything we need to do?
regards
Anthony
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Hi Maxwell Forest,
Can you please let me know about the SDK that you are using ?
Thanks MT_dialog
嗨,麦克斯韦,
Also can you please provide, schematic, BOM and layout in order to have a look ?
Thanks MT_dialog
Hi there,
最初的设计佤邦s proto-typed using a DA-14580 packaged chip, production is using a die. The schematic is the same as the proximity tag application, although we have properly implemented the FET control of the FLASH, that was not operational in the code supplied by Dialog.
Note after antenna tuning component position " L2" is now a 1.5pF capacitor, and position "C9' is now a 15nH inductor.
Also note there additional components on the schematic that are not fitted and are for future use:
Not fitted: D2, D3, D4, R7, R8, R9, LS1 R10, R11, R12, R13, R14, R15, R16, Q1.
Note also that there are additional pads for the Wire bond out testing.
My S/W guy is on leave, but I will back to you soon with the SDK details
This schematic is private and confidential.
regards
Anthony
Please put this on hold for the moment, I can confirm that the 16M crystal was not calibrated, on average that would mean it was -22ppm low in frequency.
We will correct this and retest and keep you posted.
regards
Anthony
Hi guys, the SDK we are using is 5.0.3.
Hi MaxwellForest,
Is there any update on the ticket ? Have you retested the device ?
Thanks MT_dialog
This was a false alarm. The 16M crystal had not been calibrated at the factory prior to testing. Calibration fixed the problem.